Identification and Kinetic Properties of the Photosensitive Impurities and Defects in High-Purity Semi-Insulating Silicon Carbide in Properties and Applications of Silicon Carbide

V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine

National Academy of Sciences of Ukraine

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D.V. Savchenko, B.D. Shanina, E.N. Kalabukhova // edited by Rosario Gerhardt, InTech,536p. (33,5), Part A: «Thin Films and Electromagnetic Applications», Ch.1, pp.3-28, ISBN: 978-953-307-201-2 (2011)

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