Intrinsic defects in SiC nanoparticles as studied by pulsed electron paramagnetic resonance

V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine

National Academy of Sciences of Ukraine

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D.V. Savchenko, A. Pöppl, J. Hoentsch, E.N. Kalabukhova, Y. Bulois, A. Kassiba // Solid State Communications, v.146, №1-2, p.83–87 (2008)