Luminescence and EPR studies of defects in Si-SiO2 films

V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine

National Academy of Sciences of Ukraine

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M. Baran, B. Bulakh, N. Korsunska, L. Khomenkova, J. Jedrzejewski // Eur. Phys. J.:Appl. Phys..-2004.-V.27.-P. 285-289.