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L. Khomenkova, M. Baran, J. Jedrzejewski, C. Bonafos, V. Paillard, Y. Venger, I. Balberg, N. Korsunska // AIMS Materials Science. – 2016. – v.3(2). – p.538-561. DOI: 10.3934/matersci.2016.2.538.
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V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine
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