Extraction of optical constants of polyaniline thin films by surface plasmon resonance

V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine

National Academy of Sciences of Ukraine

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O.Yu. Posudievsky, A.V. Samoylov, E.R. Surovtseva, R.V. Khristosenko, A.L. Kukla, Yu.M. Shirshov // Thin Solid Films, 2008, Vol.516, pp. 6104-6109