Surface plasmon resonance spectroscopy: prospects of superstrate refractive index variation for separate extraction of molecular layer parameters

V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine

National Academy of Sciences of Ukraine

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Beketov G.V., Shirshov Yu.M., Shinkarenko E.V., Chegel V.I. // Sensors & Actuators B48, 1998, p. 425-432