Physical principles and methods for noise diagnostic of optoelectronic device quality and reliability

V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine

National Academy of Sciences of Ukraine

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N.B.Lukyanchikova // In: ”Noise and Reliability of Semiconductor Devices” - 1995, Ed. J.Sikula and P.Shauer, Technical University Brno. - Р.129-134.

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