V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine
National Academy of Sciences of Ukraine

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Contactless interference 3D profilometer “Micron-alpha”

We offer measurement services based on 3D profilometer “Micron-alpha”:

- rendering of two- and three-dimensional images of surface
- estimation of quantitatively relief characteristics
- measurements of the thickness of thin films
- carrying out the metallurgical study.

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FemtoScan – multifunctional scanning probe microscope with full Internet control

Purpose: for the study of surface morphology and local properties with subnanometer space resolution in air and liquids

More than 50 different modes, including:

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